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[IEEE 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Karlovy Vary (2013.4.8-2013.4.10)] 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Test pattern decompression in parallel scan chain architecture

โœ Scribed by Chloupek, M.; Jenicek, J.; Novak, O.; Rozkovec, M.


Book ID
120573532
Publisher
IEEE
Year
2013
Weight
772 KB
Category
Article
ISBN
1467361348

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