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X-Ray Topography and Crystal Characterization || Measurement of Elastic Shear Strain by White-Beam SR Topography

✍ Scribed by Jaroslav Brádler, Milena Polcarová, Juliana Gemperlová, Amand George and Alain Jacques

Book ID
123646386
Publisher
The Royal Society
Year
1999
Tongue
English
Weight
682 KB
Volume
357
Category
Article
ISSN
0264-3952

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