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Characterization of structural defects in MLEK grown InP single crystals using synchrotron white beam X-ray topography

✍ Scribed by H. Chung; W. Si; M. Dudley; A. Anselmo; D.F. Bliss; A. Maniatty; H. Zhang; V. Prasad


Book ID
108342419
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
557 KB
Volume
174
Category
Article
ISSN
0022-0248

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