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X-ray imaging of structural defects in Si1−xGexsingle crystals using a white synchrotron beam

✍ Scribed by T. S. Argunova; A. G. Zabrodskii; L. M. Sorokin; N. V. Abrosimov; J. H. Je

Book ID: 111438560
Publisher: SP MAIK Nauka/Interperiodica
Year: 2011
Tongue: English
Weight: 999 KB
Volume: 56
Category: Article
ISSN: 1063-7745
DOI: 10.1134/s1063774511050038

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