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X-ray topographic investigation of large oxygen precipitates in silicon

✍ Scribed by W. Wierzchowski; K. Wieteska; W. Graeff; M. Pawłowska; B. Surma; S. Strzelecka

Book ID: 117622155
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 729 KB
Volume: 362
Category: Article
ISSN: 0925-8388
DOI: 10.1016/s0925-8388(03)00603-0

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