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X-ray topographic characterization of porous silicon layers

✍ Scribed by K. Barla; G. Bomchil; R. Herino; J.C. Pfister; J. Baruchel

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 574 KB
Volume: 68
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(84)90110-6

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