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X-ray Reflectivity Characterization of ZnO/Al 2 O 3 Multilayers Prepared by Atomic Layer Deposition

✍ Scribed by Jensen, J. M.; Oelkers, A. B.; Toivola, R.; Johnson, D. C.; Elam, J. W.; George, S. M.

No coin nor oath required. For personal study only.

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