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X-ray photoelectron spectroscopy analysis of the growth kinetics of Ge on Si(001)

✍ Scribed by Eliezer D. Richmond

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 621 KB
Volume: 252
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90780-3

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