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X-ray photoelectron spectroscopy analysis of GaN/(0001)AlN and AlN/(0001)GaN growth mechanisms

✍ Scribed by King, S. W.; Carlson, E. P.; Therrien, R. J.; Christman, J. A.; Nemanich, R. J.; Davis, R. F.

Book ID: 125433620
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 748 KB
Volume: 86
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.371564

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