✦ LIBER ✦

X-ray photoelectron characterization of SiO2 aerogel

✍ Scribed by M.W. Connor; C. Colmenares

Book ID: 115990810
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 311 KB
Volume: 201
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(95)00622-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Structural characterization of SiO2 aero

Structural characterization of SiO2 aerogels

✍ B. Himmel; H. Bürger; Th. Gerber; A. Olbertz 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 818 KB

SiO2 film thickness metrology by x-ray p

SiO2 film thickness metrology by x-ray photoelectron spectroscopy

✍ Lu, Z. H.; McCaffrey, J. P.; Brar, B.; Wilk, G. D.; Wallace, R. M.; Feldman, L. 📂 Article 📅 1997 🏛 American Institute of Physics 🌐 English ⚖ 519 KB

X-Ray Photoelectron Spectroscopy of Sulf

X-Ray Photoelectron Spectroscopy of Sulfur Containing Ni/SiO2 Catalysts

✍ M. Montes; M. Genet; B. K. Hodnett; W. E. Stone; B. Delmon 📂 Article 📅 2010 🏛 Wiley (John Wiley & Sons) ⚖ 486 KB

Attempts were made t o regenerate two Ni/SiO c a t a l y s t s which were exposed t o s u l f u rcontaining compounds. Attempted regeneration wag by o x i d a t i o n followed by reduction. amount o f s u l f u r present a f t e r these treatments was followed by chemical a n a l y s i s and X-ray p

X-ray photoelectron spectroscopic analys

X-ray photoelectron spectroscopic analysis of HfO2/Hf/SiO2/Si structure

✍ Ruiqin Tan; Yasushi Azuma; Isao Kojima 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 173 KB

Surface studies of TiO2SiO2 glasses by

Surface studies of TiO2SiO2 glasses by X-ray photoelectron spectroscopy

✍ Sharmila M. Mukhopadhayay; Stephen H. Garofalini 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 494 KB

X-ray photoelectron study of TiN/SiO2 an

X-ray photoelectron study of TiN/SiO2 and TiN/Si interfaces

✍ A.R. Chourasia; D.R. Chopra 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 441 KB