X-Ray Photoelectron Spectroscopy of Sulfur Containing Ni/SiO2 Catalysts

✍ Scribed by M. Montes; M. Genet; B. K. Hodnett; W. E. Stone; B. Delmon

• Publisher: Wiley (John Wiley & Sons)
• Year: 2010
• Weight: 486 KB
• Volume: 95
• Category: Article
• ISSN: 0037-9646
• DOI: 10.1002/bscb.19860950101

✦ Synopsis

Attempts were made t o regenerate two Ni/SiO c a t a l y s t s which were exposed t o s u l f u rcontaining compounds. Attempted regeneration wag by o x i d a t i o n followed by reduction. amount o f s u l f u r present a f t e r these treatments was followed by chemical a n a l y s i s and X-ray photoelectron spectroscopy. Oxidation and reduction was successful i n removing a l a r g e p a r t o f the s u l f u r but c a t a l y t i c a c t i v i t y f o r benzene hydrogenation could n o t be restored. The XPS data i n d i c a t e t h a t the small amounts o f s u l f u r which remained a f t e r treatment i n hydrogen were located l a r g e l y i n t h e b u l k r a t h e r than a t t h e surface o f t h e n i c k e l p a r t i c l e s .