✦ LIBER ✦

X-ray diffractometry situ of evaporated thin films: application to amorphous tellurium

✍ Scribed by J.C. Malaurent; J. Dixmier

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

In situ X-ray diffractometry of evaporat

✍ J.C. Malaurent; J. Dixmier 📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 39 KB

Characterization of ex-situ hydrogenated

✍ S. Kennou; S. Ladas; E.C. Paloura; J.A. Kalomiros 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 350 KB

Application of the Phase-Retrieval X-Ray

✍ Nikulin, A.Y. ;Siu, K. ;Davis, J.R. ;Zaumseil, P. ;Souvorov, A.Y. ;Freund, A. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 147 KB 👁 2 views

Recent advances in high-resolution X-ray

✍ A. Boulle; R. Guinebretière; O. Masson; R. Bachelet; F. Conchon; A. Dauger 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 983 KB

Search for an absolute method of analysi

📂 Article 📅 1964 🏛 Elsevier Science 🌐 English ⚖ 116 KB