๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

โœ Scribed by S. Kennou; S. Ladas; E.C. Paloura; J.A. Kalomiros


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
350 KB
Volume
90
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES