Application of the Phase-Retrieval X-Ray Diffractometry to an Ultra-High Spatial Resolution Mapping of SiGe Films near the Absorption Edge of Ge

✍ Scribed by Nikulin, A.Y. ;Siu, K. ;Davis, J.R. ;Zaumseil, P. ;Souvorov, A.Y. ;Freund, A.

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 147 KB
• Volume: 184
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200103)184:1<145::aid-pssa145>3.0.co;2-y