✦ LIBER ✦
Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
✍ Scribed by A. Boulle; R. Guinebretière; O. Masson; R. Bachelet; F. Conchon; A. Dauger
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 983 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0169-4332
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