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X-ray Diffraction Study of Composition Inhomogeneities in Ga1–xInxN Thin Layers

✍ Scribed by E. Zielinska-Rohozanska; J. Gronkowski; M. Regulska; M. Majer; K. Pakula

Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
151 KB
Volume
36
Category
Article
ISSN
0232-1300

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