A Comparative Study of (Cu-III-Se2)x-(FeSe)1?x Alloys (III: Al, Ga, In) (0 ? x ? 1) by X-Ray Diffraction, Differential Thermal Analysis and Scanning Electron Microscopy

X-Ray Diffraction (XRD), Differential Th

X-Ray Diffraction (XRD), Differential Thermal Analysis (DTA), and Scanning Electron Microscopy (SEM) of (CuInSe2)1?x (VSe)x Alloys (0 ?x ? 0.5)

✍ Grima Gallardo, P. ;Dur�n, S. ;Quintero, M. ;Mu�oz, M. ;Delgado, G. ;Brice�o, J. 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 144 KB 👁 1 views

Polycrystalline samples of (CuInSe 2 ) 1--x (VSe) x alloys have been prepared by the usual melt and anneal technique in the composition range 0 x 0.5. X-ray diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscopy techniques were used to characterize the products. By S