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X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films

✍ Scribed by Kaganer, V. M.; Brandt, O.; Trampert, A.; Ploog, K. H.

Book ID: 118031836
Publisher: The American Physical Society
Year: 2005
Tongue: English
Weight: 647 KB
Volume: 72
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.72.045423

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