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X-ray diffraction peak broadening and lattice strain in LaNi5-based alloys

โœ Scribed by Yumiko Nakamura; Keisuke Oguro; Itsuki Uehara; Etsuo Akiba


Book ID
117625830
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
216 KB
Volume
298
Category
Article
ISSN
0925-8388

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โœ Sanjay K. Rai; Anish Kumar; Vani Shankar; T. Jayakumar; K. Bhanu Sankara Rao; Ba ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 290 KB

This study demonstrates that, three parameters which are microstrain, lattice parameter and crystallite size, obtained from X-ray diffraction line profile analysis, can be used in a complementary way to study the precipitation/dissolution of various intermetallics and carbides in nickel base superal