Characterization of microstructures in Inconel 625 using X-ray diffraction peak broadening and lattice parameter measurements
β Scribed by Sanjay K. Rai; Anish Kumar; Vani Shankar; T. Jayakumar; K. Bhanu Sankara Rao; Baldev Raj
- Book ID
- 113895026
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 290 KB
- Volume
- 51
- Category
- Article
- ISSN
- 1359-6462
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β¦ Synopsis
This study demonstrates that, three parameters which are microstrain, lattice parameter and crystallite size, obtained from X-ray diffraction line profile analysis, can be used in a complementary way to study the precipitation/dissolution of various intermetallics and carbides in nickel base superalloy Inconel 625, without extracting the precipitates from the matrix.
π SIMILAR VOLUMES
The possibilities and limits of the polynomial approximation for an accurate determination of the peak position of X-ray diffraction profiles in precision lattice parameter measurements according to the BOND-method are investigated. The use of a polynomial approximation with reciprocal measuring val
## Abstract As a precursor material for electrooptical applications in the integrated optics, nominal pure as well as Znβdoped stoichiometric LiNbO~3~ thin films of a few Β΅m thickness were grown by liquid phase epitaxy on congruent LiNbO~3~ substrates. The crystalline perfection and lattice paramet