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Estimation of lattice strain in nanocrystalline silver from X-ray diffraction line broadening

✍ Scribed by V. Biju; Neena Sugathan; V. Vrinda; S. L. Salini

Publisher: Springer
Year: 2007
Tongue: English
Weight: 364 KB
Volume: 43
Category: Article
ISSN: 0022-2461
DOI: 10.1007/s10853-007-2300-8

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