Precision Lattice Parameter Measurements by Interfereces from Lattice Sources (Kossel Lines) and Divergent Beam X-Ray Diffraction (Pseudo-Kossel-Lines) in Back Reflection

✍ Scribed by H. -J. Ullrich

• Publisher: John Wiley and Sons
• Year: 1967
• Tongue: English
• Weight: 189 KB
• Volume: 20
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/pssb.19670200254