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An Enhanced Technique for the Characterisation of Crystal Lattice Strains in Epitaxially Grown Layers from X-ray Diffraction Profiles

โœ Scribed by Nikulin, A. Yu. ;Zaumseil, P.


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
265 KB
Volume
158
Category
Article
ISSN
0031-8965

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