An Enhanced Technique for the Characterisation of Crystal Lattice Strains in Epitaxially Grown Layers from X-ray Diffraction Profiles

✍ Scribed by Nikulin, A. Yu. ;Zaumseil, P.

• Publisher: John Wiley and Sons
• Year: 1996
• Tongue: English
• Weight: 265 KB
• Volume: 158
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211580219