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Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks

✍ Scribed by Balzar, D. ;Ledbetter, H.

Book ID: 114500667
Publisher: International Union of Crystallography
Year: 1993
Tongue: English
Weight: 749 KB
Volume: 26
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889892008987

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