✦ LIBER ✦
Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis
✍ Scribed by T Ungár; S Ott; P.G Sanders; A Borbély; J.R Weertman
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 307 KB
- Volume
- 46
- Category
- Article
- ISSN
- 1359-6454
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