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Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

✍ Scribed by de Keijser, Th. H. (author);Langford, J. I. (author);Mittemeijer, E. J. (author);Vogels, A. B. P. (author)

Book ID: 114499420
Publisher: International Union of Crystallography (IUCr)
Year: 1982
Tongue: English
Weight: 698 KB
Volume: 15
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889882012035

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