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X-Ray diffraction of graphite-ICI residue compounds

✍ Scribed by M. Saito; T. Tsuzuku


Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
268 KB
Volume
15
Category
Article
ISSN
0008-6223

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Residual stress in particulate epoxy res
✍ Takashi Nishino; Xu Airu; Takeshi Matsumoto; Kanki Matsumoto; Katsuhiko Nakamae πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 463 KB πŸ‘ 2 views

Residual stress in particulate epoxy resin was investigated by X-ray diffraction. Microdeformation of incorporated A1 and a-Si02 crystal, which was induced by the residual stress, could be detected as a shift of X-ray diffraction peak. The residual stress at the interface between the adherend and th