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Residual stress measurements on Al-graphite composites using X-ray diffraction

✍ Scribed by Swe-Den Tsai; Deepak Mahulikar; H.L. Marcus; Ismail C. Noyan; J.B. Cohen


Publisher
Elsevier Science
Year
1981
Weight
360 KB
Volume
47
Category
Article
ISSN
0025-5416

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Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th