The temperature dependence of the (001) X-ray reflections in graphite-Fe& is reported. The c-axis unit cell, I,, shows a large expansion with increasing temperature, associated with a large relative expansion of the Fe-Cl interplanar distances and a smaller expansion of the graphite-intercalant inte
β¦ LIBER β¦
37. Monitoring graphitization temperatures by X-ray diffraction
β Scribed by R Shemenski; I.W Gazda; J.A Harvey
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 137 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0008-6223
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Low temperature x-ray diffraction study
β
H. Mazurek; G. Ghavamishahidi; G. Dresselhaus; M.S. Dresselhaus
π
Article
π
1982
π
Elsevier Science
π
English
β 403 KB
19. Graphitization studies by X-ray tech
β
E Fitzer; S Weisenburger
π
Article
π
1973
π
Elsevier Science
π
English
β 262 KB
X-Ray diffraction of graphite-ICI residu
β
M. Saito; T. Tsuzuku
π
Article
π
1977
π
Elsevier Science
π
English
β 268 KB
Graphitization studies by in situ X-ray
β
E. Fitzer; S. Weisenburger
π
Article
π
1974
π
Elsevier Science
π
English
β 815 KB
A high temperature X-ray diffractometer attachment was used to study the progress of graphitization of two cokes. By devising a quick electrical heating technique and using rapid scanning, the profiles of the ( 002), (loo), (lOl), ( 004), ( 110) and ( 112) reflections were measured as a function of
X-ray diffraction of Croft's graphite/ch
β
L.B. Ebert; J.C. Scanlon
π
Article
π
1987
π
Elsevier Science
π
English
β 272 KB
Defect characterization in CeO2βx at ele
β
John Faber Jr.; Martin A. Seitz; M.H. Mueller
π
Article
π
1976
π
Elsevier Science
π
English
β 587 KB