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X-Ray Diffraction as a Local Probe Tool

✍ Scribed by J. Stangl; C. Mocuta; A. Diaz; T. H. Metzger; G. Bauer

Publisher: John Wiley and Sons
Year: 2009
Tongue: English
Weight: 602 KB
Volume: 10
Category: Article
ISSN: 1439-4235
DOI: 10.1002/cphc.200900563

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