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X-ray topography as a tool in crystal growth studies

✍ Scribed by A. Authier

Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
723 KB
Volume
13-14
Category
Article
ISSN
0022-0248

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X-ray topography and crystal orientation
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## Abstract A study of the crystal orientation and structural perfection of single crystal blades obtained by Bridgeman method from CMSX‐4 nickel superalloy at various withdrawal rates between 1 and 5 mm/min was carried out using the Laue diffraction method and X‐ray diffraction topography methods