X-ray photoelectron diffraction: a sensitive probe of adsorbate and surface structure
β Scribed by D.A. Wesner
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 215 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0042-207X
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X-ray photoelectron spectroscopy (XPS) is a surface sensitive analytical technique that measures the binding energy of electrons in atoms and molecules on the surface of a material. XPS was used to determine the distribution of the oligosaccharide side chains in the glycoprotein, MUC1 mucin. Low-res
Surface-sensitive x-ray analysis techniques are explained. Using grazing-exit geometry, structural information about a sample surface could be obtained by measuring the angular distribution of x-ray fluorescence or x-ray diffraction intensity. A model based on the reciprocity theorem was used and it