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In-Situ X-ray Diffraction as a Tool to Probe Mechanical Phenomena Down to the Nano-Scale

✍ Scribed by J. Keckes; E. Eiper; K. J. Martinschitz; P. Boesecke; W. Gindl; G. Dehm

Publisher: John Wiley and Sons
Year: 2006
Tongue: English
Weight: 176 KB
Volume: 8
Category: Article
ISSN: 1438-1656
DOI: 10.1002/adem.200600156

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