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X-ray diffraction and electron microscopy investigation of porous Si1−xGex

✍ Scribed by D Buttard; M Schoisswohl; J.L Cantin; H.J von Bardeleben


Book ID
108389020
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
266 KB
Volume
297
Category
Article
ISSN
0040-6090

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## Abstract In the present work, investigations on the microstructure of a commercial purity 1100 aluminum that had been subjected to moderate to strong deformation (strains of 1 to 4) by equal channel angular pressing (ECAP) were carried out using X‐ray diffraction (XRD) and scanning electron micr