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Electron and X-ray diffraction investigations of thin chromium films

✍ Scribed by H. Nörenberg; H.-G. Neumann

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 503 KB
Volume: 198
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(91)90343-v

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