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X-ray characterization of the microstructure in a CdTe epitaxial layer

✍ Scribed by Dachao Gao; Andrew W. Stevenson; Stephen W. Wilkins; Geoff N. Pain

Book ID
103427620
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
889 KB
Volume
206
Category
Article
ISSN
0040-6090

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## Abstract We report on the atmospheric pressure metalorganic vapour phase epitaxy of both nominally undoped and iodine (I) donor doped CdTe layers on high resistivity (111)B CdTe substrates, as a preliminary step towards the fabrication of p‐i‐n diode X‐ray detectors. CdTe epilayers were grown at