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Structure Characterization of (Al,Ga)N Epitaxial Layers by Means of X-Ray Diffractometry

✍ Scribed by J. Kozłowski; R. Paszkiewicz; M. Tłaczała

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 103 KB
Volume: 228
Category: Article
ISSN: 0370-1972
DOI: 10.1002/1521-3951(200111)228:2<415::aid-pssb415>3.0.co;2-u

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