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Determination of Total Reflectivity and Diffraction Parameters of Structure Perfection of Silicon Monocrystals by Triple-Crystal X-Ray Diffractometry

✍ Scribed by Novikov, N. N. ;Sushko, V. G.

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 185 KB
Volume: 168
Category: Article
ISSN: 0031-8965
DOI: 10.1002/(sici)1521-396x(199808)168:2<359::aid-pssa359>3.0.co;2-#

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