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The X-Ray Triple Crystal Diffractometry of Silicon Monocrystals with Ordered Dislocation Structure

✍ Scribed by Novikov, N. N. ;Shevtsiv, I. V. ;Shvidky, V. A. ;Teselko, P. O.


Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
272 KB
Volume
161
Category
Article
ISSN
0031-8965

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