✦ LIBER ✦

X-ray characterization of crystal perfection and surface contamination in large-diameter silicon wafers

✍ Scribed by Seiji Kawado

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of Dislocation Densitie

✍ Sous, S. A. ;Hildmann, B. O. ;Kaysser, W. A. 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 292 KB 👁 2 views

Characterization of Lattice Damage in Io

✍ Cembali, F. ;Mazzone, A. M. ;Servidori, M. 📂 Article 📅 1985 🏛 John Wiley and Sons 🌐 English ⚖ 154 KB

On the Transition of the Dynamical Case

✍ Khrupa, V. I. ;Entin, I. R. ;Datsenko, L. I. 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 377 KB

Characterization of silicon carbide surf

✍ C. Jordan; H. Schillinger; L. Dressler; S. Karmann; W. Richter; K. Goetz; G. Mar 📂 Article 📅 1997 🏛 Springer 🌐 English ⚖ 913 KB

329. Angular dependence of external x-ra

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 133 KB