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Characterization of silicon carbide surfaces of 6H-, 15R- and 3C-polytypes by optical second-harmonic generation in comparison with X-ray diffraction techniques

✍ Scribed by C. Jordan; H. Schillinger; L. Dressler; S. Karmann; W. Richter; K. Goetz; G. Marowsky; R. Sauerbrey


Publisher
Springer
Year
1997
Tongue
English
Weight
913 KB
Volume
65
Category
Article
ISSN
1432-0630

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