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X-ray and transmission electron microscopy analysis of imperfect GexSi1−x/Si strained-layer superlattices

✍ Scribed by J. H. Li; X. F. Duan; Z. H. Mai; S. F. Cui

Publisher: Springer
Year: 1993
Tongue: English
Weight: 753 KB
Volume: 12
Category: Article
ISSN: 0261-8028
DOI: 10.1007/bf00277081

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