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VSM measurements of critical currents for 2H+ and 16O+ low energy ion implanted YBa2Cu3O7−x thin films

✍ Scribed by Radcliffe, J.W.; Cohen, L.F.; Perkins, G.K.; Caplin, A.D.; Tate, T.J.; Lee, M.J.; Saba, F.M.; Quincey, P.; Somekh, R.E.; Przyslupski, P.

Book ID
123422028
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
348 KB
Volume
195
Category
Article
ISSN
0925-8388

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