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SIMS study of low energy 2H+ ion-implanted YBa2Cu3O7−δ thin films

✍ Scribed by Saba, F.M.; Kilner, J.A.; Tate, T.J.; Lee, M.J.; Radcliffe, J.W.; Cohen, L.F.; Quincey, P.; Somekh, R.E.; Przyslupski, P.

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