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Void formation at the interface in Sn/Cu solder joints

โœ Scribed by Yang Yang; Hao Lu; Chun Yu; Yongzhi Li


Book ID
113800504
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
758 KB
Volume
51
Category
Article
ISSN
0026-2714

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Effects of residual S on Kirkendall void
โœ Jin Yu; J.Y. Kim ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 692 KB

Solder joints of Cu/Sn-3.5Ag were prepared using Cu foil or electroplated Cu films with or without SPS additive. With a high level of SPS in the Cu electroplating bath, voids tended to localize at the Cu/Cu 3 Sn interface during subsequent aging at 150 ยฐC, which was highly detrimental to the drop im