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VB-7 InP/InGaAsP/InGaAs avalanche photodiodes grown by chemical-beam epitaxy

โœ Scribed by Campbell, J.C.; Tsang, W.T.; Qua, G.J.; Johnson, B.C.


Book ID
114596188
Publisher
IEEE
Year
1987
Tongue
English
Weight
163 KB
Volume
34
Category
Article
ISSN
0018-9383

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SIMS analysis of InP, GaAs and InGaAs la
โœ Y. Gao; S. Godefroy; J. L. Benchimol; F. Alaoui; F. Alexandre; K. Rao ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 364 KB

## Abstract SIMS analysis was applied to the characterization of InP, GaAs and InGaAs grown by chemical beam expitaxy (CBE). It includes the control of purity and doping, and the determination of growth rate and matrix composition. Some important characteristics of CBE growth, such as carbon incorp