๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system

โœ Scribed by S.M. Schwarz; B.W. Kempshall; L.A. Giannuzzi; F.A. Stevie

Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
110 KB
Volume
50
Category
Article
ISSN
1359-6454

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Measurement of the grain boundary diffus
Measurement of the grain boundary diffusion of In in Ni bicrystals by the SIMS technique
โœ W. Gust; M. R Hintz; A. Lodding; H. Odelius; B. Predel ๐Ÿ“‚ Article ๐Ÿ“… 1982 ๐Ÿ› Elsevier Science โš– 989 KB

The diffusivity of indium as an impurity along grain boundaries in nickel bicrystals of known orientation has been measured using secondary ion mass spectrometry ISIMS). The values obtained are very large and comparable in magmtude to those observed by Hillert and Purdy. and by Smidoda. Gottschalk a

Grain boundary diffusion in Cr-doped NiO
Grain boundary diffusion in Cr-doped NiO and the oxidation of Ni-Cr alloy
โœ Dr. Alan Atkinson; Dr. D. W. Smart; Dr. R. I. Taylor ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› John Wiley and Sons ๐ŸŒ German โš– 826 KB

We have measured the diffusion of aNi radiotracer into polycrystalline NiO. nominally doped with 0.1% Cr (Cr/Ni ratio) in the temperature range 600 to 900ยฐC. The experiments show that Cr doping increases diffusion of Ni in the oxide lattice, but decreases diffusion of Ni along grain boundaries provi