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Diffusion induced grain boundary migration in the Cu-Cd system

โœ Scribed by B.K Gupta; M.K Madhuri; S.P Gupta

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
758 KB
Volume
51
Category
Article
ISSN
1359-6454

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Quantitative analysis of observations on diffusion induced grain boundary migration for random boundaries in the Cu(Zn) system using a driving force model
โœ Y. Yamamoto; M. Kajihara ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 224 KB

AbstractรDiusion induced grain boundary migration (DIGM) in the Cu(Zn) system was experimentally studied by Li and Hillert using polycrystalline Cu specimens zinciยฎed with binary CuยฑZn alloys containing 3.9ยฑ30.5 wt% of Zn at temperatures between 573 and 773 K. Their experimental results have been qu