✦ LIBER ✦

Using thin-film X-ray diffraction to study ion implanted metal

✍ Scribed by Yan Pengxun

Book ID: 113300228
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 373 KB
Volume: 33
Category: Article
ISSN: 0254-0584
DOI: 10.1016/0254-0584(93)90096-5

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