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High resolution X-ray diffraction studies on hexaphenyl thin films

✍ Scribed by R Resel; G Leising

Book ID: 117218517
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 143 KB
Volume: 409
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(98)00230-1

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